Producer: FEI
Model: QUANTA 450 FEG
Production year: 2015
Description:
High resolution scanning electron microscope with field emission FEI Quanta FEG 450, with the possibility of obtaining SEM and STEM images on conductive samples, non-conductive and also nanoparticle solutions in their natural state without the necessity of sample preparation.
Minimum imaging resolution with secondary electrons at 30kV:
- 1 nm or better in high vacuum operating mode;
- 5 nm or better in low vacuum operating mode;
Precise temperature control between -20 C si +60 C;
Color mixing of images obtained from 2 or 3 independent detectors in order to obtain an image in pseudo-colors for highlighting the angle or energetic scattering signal;
Simultaneous acquisition, from a single scan, of 4 images from different sources (detectors or segments of the same detector) for reducing the scanning time;
1) Everhart-Thornley conventional detector (SED) for signal detection of secondary electrons (SE), can operate in two modes – SE and BSE- depending on polarization
2) Secondary electrons detector in gaseous environment with a wide viewing field, Large Field Detector Detector-Gaseous Secondary Electrons (LF-GSED) imaging in vacuum, both high and low voltages
3) Gaseous Secondary Electrons Detector (GSED) optimized for secondary electron imaging in ultra-low vacuum (ESEM) and gaseous media
4) Solid State – Directional Back-Scattered Detector (DBS) optimized to work in High Vacuum and Low Vacuum for imaging the composition and topography of the area studied by detecting back-scattered electrons of the sample under different angles, from 0º to 90º
5) Secondary electrons detector (SE) mounted in column. The In-Column Detector (ICD) is a scintillation detector that has the possibility during the deceleration beam in high vacuum to detect the signal with a resolution of 1.0 nm
6) STEM detector with semiconductors for high-resolution in bright field and dark field imaging for samples of low density prepared for TEM (ie. Cross-sectional beam focused ion) and measurement of critical dimensions
7) Detector WetSTEM and Peltier temperature controller / Stage Heating Control Kit that enables thin or thick (bulk) sample analysis, fully hydrated, allowing control of both temperature and pressure during viewing and analyzing of the studied samples
8) EDS detector with Silicon Drift technology (SDD) -EDAX Octane Plus
9) IR-CCD camera for safe viewing and positioning of the sample
10) CCD color optical camera called Nav-Cam 450 for global viewing a sample in order to achieve easy, intuitive navigation
