Producer: NANONICS IMAGING LTD
Model: MultiView 4000SPM/NSOM
Production year: 2015
Description:
The system includes two flat piezo scanners for tip and sample
The scanning head has the following characteristics:
Side Scan area: 85 microns
Axial scanning area: 85 microns
Central opening: 24 mm
Sample support with XYZ scanning> 30 microns.
Feedback on amplitude and phase with independent amplitude monitoring
Scanning depth of up to 30 microns
Using atomic force feedback in normal force without optical interferences
Anti-vibration table and enclosure separating the external environment to ensure system functionality as an AFM microscope
